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- Hui, Zhenzhen, et al. Show all 11 Authors
- RSC advances 2014 v.4 no.24 pp. 12568-12571
- X-ray photoelectron spectroscopy; films (materials); nanocrystals; stoichiometry; temperature
- ... CrN thin films are first prepared by a facile chemical solution deposition method. The results show that the derived CrN thin films are nanocrystalline with the grain size of 30–60 nm. X-ray photoelectron spectroscopy measurement shows the stoichiometry of the derived thin film. The temperature dependent resistivity within the range of 2–300 K shows a semiconductor-like behavior with dρ/dT < 0 and ...