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- Bhattacharyya, Somnath, et al. Show all 3 Authors
- Journal of materials science 2016 v.51 no.3 pp. 1484-1489
- annealing; strontium; temperature; titanium; transmission electron microscopy
- ... We have measured the mean inner potential depth at a Σ5 grain boundary in a SrTiO₃ bicrystal by reconstructing the exit-face wave function from an image focal series collected by transmission electron microscopy. We find that, as the annealing temperature increases, the potential depth at the grain boundary exponentially increases. We interpret the temperature dependence of the potential depth as ...