Jump to Main Content
- Carrington, P. J., et al. Show all 8 Authors
- Journal of materials science 2019 v.54 no.4 pp. 3230-3241
- chemical structure; image analysis; quantitative analysis; semiconductors
- ... The qHAADF method allows the quantification of the composition at atomic column resolution in semiconductor materials by comparing the HAADF-STEM intensities between a region of interest to a region of the material of known composition. However, the application of this qHAADF approach requires both regions to be differentiable and included in the same micrograph at close proximity. This limits the ...