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- Granell, P. N., et al. Show all 9 Authors
- Journal of physical chemistry 2019 v.123 no.6 pp. 3579-3587
- atomic force microscopy; electric field; electrochemistry; nanosilver; physical chemistry; porous media; silicon; silver; titanium dioxide
- ... Conductive-tip atomic force microscopy (CAFM) was used to explore the effects of high electric fields on silver nanoparticle (NP) arrays embedded inside the pores of mesoporous TiO₂ thin films (MTF). A controlled local modification of the distribution of Ag nanoparticles inside the MTF and their electronic transport properties was carried out. The process is driven by strong electrochemically indu ...