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A Bayesian Semiparametric Accelerated Failure Time Model

Author:
Walker, Stephen, Mallick, Bani K.
Source:
Biometrics 1999 v.55 no.2 pp. 477-483
ISSN:
0006-341X
Subject:
Markov chain, algorithms, biometry, models
Abstract:
A Bayesian semiparametric approach is described for an accelerated failure time model. The error distribution is assigned a Polya tree prior and the regression parameters a noninformative hierarchical prior. Two cases are considered: the first assumes error terms are exchangeable; the second assumes that error terms are partially exchangeable. A Markov chain Monte Carlo algorithm is described to obtain a predictive distribution for a future observation given both uncensored and censored data.
Agid:
134518