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Mapping of Quantitative Trait Loci for Leaf Rust Resistance in the Wheat Population Ning7840 × Clark

Author:
Li, Chunlian, Wang, Zhonghua, Li, Chunxin, Bowden, Robert, Bai, Guihua, Li, Chunlian, Li, Chunxin, Su, Zhenqi, Carver, Brett F.
Source:
Plant disease 2017 v.101 no.12 pp. 1974-1979
ISSN:
0191-2917
Subject:
Puccinia recondita, Triticum aestivum, additive effect, alleles, chromosomes, fungi, genotyping, inbred lines, leaf rust, mature plants, microsatellite repeats, phenotypic variation, quantitative trait loci, single nucleotide polymorphism, wheat
Abstract:
Leaf rust, caused by Puccinia triticina, is an important fungal disease of wheat (Triticum aestivum L.) and causes significant yield losses worldwide. To determine quantitative trait loci (QTLs) responsible for leaf rust resistance, a recombinant inbred line (RIL) population developed from a cross of Ning7840 × Clark was evaluated for leaf rust severity, and was genotyped for single nucleotide polymorphisms (SNPs) using 9K Illumina chips, and with simple sequence repeat (SSR) markers. Two major QTLs on chromosome arms 7DS and 3BS, and two minor QTLs on chromosomes 5AS and 6AS showed a significant effect on leaf rust severity. The 7DS QTL from Ning7840 and the 3BS QTL from Clark explained, respectively, about 35% and 18% of the phenotypic variation for leaf rust resistance. The QTL on 7DS was confirmed to be Lr34. The QTL on 3BS, QLr.hwwg-3B.1, was associated with adult plant resistance and was provisionally identified as Lr74. QLr.hwwg-5AS and QLr.hwwg-6AS from Ning7840 and Clark, respectively, may correspond to previously described QTLs. Lr34, QLr.hwwg-3BS.1, and QLr.hwwg-6AS had an additive effect on leaf rust severity. RILs with all three favorable alleles showed the highest resistance to leaf rust and the RILs with none of them showed the lowest resistance.
Agid:
5860810
Handle:
10113/5860810