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Novel Conductive Filament Metal–Interlayer–Semiconductor Contact Structure for Ultralow Contact Resistance Achievement

Kim, Seung-Hwan, Kim, Gwang-Sik, Park, June, Lee, Changmin, Kim, Hyoungsub, Kim, Jiyoung, Shim, Joon Hyung, Yu, Hyun-Yong
ACS applied materials & interfaces 2018 v.10 no.31 pp. 26378-26386
materials science, semiconductors, viability
In the post-Moore era, it is well-known that contact resistance has been a critical issue in determining the performance of complementary metal-oxide–semiconductor (CMOS) reaching physical limits. Conventional Ohmic contact techniques, however, have hindered rather than helped the development of CMOS technology reaching its limits of scaling. Here, a novel conductive filament metal–interlayer–semiconductor (CF-MIS) contact—which achieves ultralow contact resistance by generating CFs and lowering Schottky barrier height (SBH)—is investigated for potential applications in various nanodevices in lieu of conventional Ohmic contacts. This universal and innovative technique, CF-MIS contact, forming the CFs to provide a quantity of electron paths as well as tuning SBH of semiconductor is first introduced. The proposed CF-MIS contact achieves ultralow specific contact resistivity, exhibiting up to ∼×700 000 reduction compared to that of the conventional metal–semiconductor contact. This study proves the viability of CF-MIS contacts for future Ohmic contact schemes and that they can easily be extended to mainstream electronic nanodevices that suffer from significant contact resistance problems.