PubAg

Main content area

MLA

van Dael, M, et al. "Combination of Shape and X-ray Inspection for Apple Internal Quality Control: In Silico Analysis of the Methodology Based On X-ray Computed Tomography." Postharvest biology and technology, v. 148, pp. 218-227. doi: 10.1016/j.postharvbio.2018.05.020

APA

van Dael, M., Verboven, P., Zanella, A., Sijbers, J., & Nicolai, B. (2019). Combination of shape and X-ray inspection for apple internal quality control: in silico analysis of the methodology based on X-ray computed tomography. Postharvest biology and technology, 148, 218-227. doi: 10.1016/j.postharvbio.2018.05.020

Chicago

van Dael, M., P Verboven, A Zanella, J Sijbers, and B Nicolai. "Combination of shape and X-ray inspection for apple internal quality control: in silico analysis of the methodology based on X-ray computed tomography" Postharvest biology and technology 148, 1 (2019): 218-227. doi: 10.1016/j.postharvbio.2018.05.020