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Investigation of adsorption/desorption behavior of Cr(VI) at the presence of inorganic and organic substance in membrane capacitive deionization (MCDI)

Chen, Lin, Wang, Chengyi, Liu, Shanshan, Zhu, Liang
Journal of environmental sciences (China) 2019 v.78 pp. 303-314
X-ray photoelectron spectroscopy, absorption, adsorption, bovine serum albumin, chromium, deionization, desorption, electrodes, energy-dispersive X-ray analysis, ions, organic matter, pH, potassium chloride, redox reactions, scanning electron microscopes, scanning electron microscopy
The adsorption and desorption behavior of Cr(VI) in membrane capacitive deionization (MCDI) was investigated systematically in the presence of bovine serum albumin (BSA) and KCl with different concentrations, respectively. Results revealed that Cr(VI) absorption was enhanced and the adsorption amount for Cr(VI) increased from 155.7 to 190.8 mg/g when KCl concentration increased from 100 to 200 mg/L in the adsorption process, which was attributed to the stronger driving force. However, the adsorption amount sharply decreased to 90.2 mg/g when KCl concentration reached up to 1000 mg/L suggesting the negative effect for Cr(VI) removal that high KCl concentration had. As for the effect of BSA on ion adsorption, the amount for Cr (VI) significantly declined to 78.3 mg/g and pH was found to be an important factor contributing to this significant reduction. Then, the desorption performance was also conducted and it was obtained that the presence of KCl had negligible effect on Cr(VI) desorption, while promoted by the addition of BSA. The incomplete desorption was obtained and the residual chromium ions onto the electrode after desorption was detected via energy-dispersive X-ray spectroscopy (EDS). Based on above analysis, the enhanced removal mechanism for Cr(VI) in MCDI was found to be consisted of ion adsorption onto electrode surface, the redox reaction of Cr(VI) into Cr(III) and precipitation, which was demonstrated by X-ray photoelectron spectroscopy (XPS) and scanning electron microscope (SEM).