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Characteristics of brush plated ZnTe thin films

Author:
Murali, K. R., Ziaudeen, M., Jayaprakash, N.
Source:
Journal of materials science 2006 v.41 no.7 pp. 1887-1892
ISSN:
0022-2461
Subject:
X-ray photoelectron spectroscopy, energy-dispersive X-ray analysis, glass, temperature, titanium, zinc
Abstract:
Zinc telluride thin films were deposited by the brush plating technique at a potential of −0.90 V (SCE) on conducting glass and titanium substrates at different temperatures in the range 30–90°C. The films were polycrystalline in nature with peaks corresponding to the cubic phase. Direct band gap of 2.30 eV was observed. XPS studiers indicated the formation of ZnTe. Depth profiling studies indicated a uniform distribution of Zn and Te throughout the entire thickness. EDAX measurements were made on the films and it was found that there was a slight excess of Te.
Agid:
6242200