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Dewetting of Thin Polymer Films on Wrinkled Graphene Oxide Monolayers

Jo, Kyoung-Il, Kim, Tae-Ho, Choi, Ki-In, Lee, Hoyeon, Choi, Jae-Hak, Bang, Joona, Kim, Tae-Hwan, Yuan, Guangcui, Satija, Sushil K., Koo, Jaseung
Langmuir 2019 v.35 no.16 pp. 5549-5556
annealing, films (materials), graphene oxide, nanosheets, polymethylmethacrylate, polystyrenes, roughness
We investigated the effect of the morphological structure of a graphene oxide (GO) monolayer on the dewetting dynamics of the upper polymer thin films. The Langmuir–Schaefer (LS) technique was used to prepare a wrinkled GO (wrGO) structure with a root mean square (rms) roughness of 22.7 Å. The dewetting behavior of poly(methyl methacrylate) (PMMA) thin films on the wrGO monolayers was perfectly prevented, whereas the PMMA thin films on a flat GO monolayer were dewetted at 203 °C. This wrinkle effect of the GO can be also obtained when the GOs monolayers are intercalated to the PMMA/polystyrene (PS) interface. In this multilayer, the flat GO monolayer at the interface between the PS and PMMA layers was spontaneously roughened with rms roughness of 46.9 Å after annealing and also prohibited the dewetting behavior. From the results, we found that to improve the compatibility of polymer blends by adding the two-dimensional nanosheets, it is important to control the morphological structure of the sheets at the interface, along with manipulation of the GO–polymer interactions.